IEEE Electron Device Letters · 2016 · 29 citations · 18 references
EngineeringElectrical EngineeringMaterials ScienceMicroelectronicsMicrowave EngineeringSemiconductor DevicesDevice CharacterizationMicrowave Semiconductor DevicesNoise In Electronic DevicesNoise In Semiconductor DevicesWide-bandgap Semiconductor DevicesWide-bandgap SemiconductorsCurrent GainLow-noise DesignLow-noise Microwave TransistorsMicrowave Noise CharacterizationNoise CharacteristicsNoise FigureNoise Performance AnalysisTransconductance
Microwave low-noise performance AlGaN/GaN HEMT on a SiC substrate with a wide head double-deck T-shaped gate has been reported. The HEMTs with gate-length ( <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$L_{\mathrm { {g}}})$ </tex-math></inline-formula> of <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$0.17~\mu \text{m}$ </tex-math></inline-formula> and source–drain spacing ( <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$L_{\mathrm { {sd}}})$ </tex-math></inline-formula> of <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$3.5~\mu \text{m}$ </tex-math></inline-formula> exhibited a maximum extrinsic transconductance of 360 mS/mm, a current gain cutoff frequency ( <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$f_{\mathrm { {T}}})$ </tex-math></inline-formula> of 50 GHz, a maximum oscillation frequency ( <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$f_{\mathrm { {max}}})$ </tex-math></inline-formula> of 149 GHz, and three-terminal breakdown voltage of 113 V. The device exhibited a minimum noise figure (NF <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$_{\mathrm { {min}}})$ </tex-math></inline-formula> of 0.50 and 0.84 dB at 10 and 18 GHz, respectively, when biased at <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$V_{\mathrm { {ds}}}= 5$ </tex-math></inline-formula> V and <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$I_{\mathrm { {ds}}}= 140$ </tex-math></inline-formula> mA/mm, which is the lowest noise characteristics ever reported for the GaN-based T-shaped gate HEMTs with gate length larger than <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$0.1~\mu \text{m}$ </tex-math></inline-formula> . This excellent noise performance is attributed to the reduction of the gate resistance resulting from a wide head T-shaped gate and the improved device characteristics.
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High-power AlGaN/GaN HEMTs for Ka-band applications
Tomás Palacios, A. Chakraborty, Siddharth Rajan et al. · IEEE Electron Device Letters · 2005 · 492 citations · Full text
The effect of gate leakage on the noise figure of AlGaN/GaN HEMTs
C. Sanabria, A. Chakraborty, Hongtao Xu et al. · IEEE Electron Device Letters · 2005 · 114 citations · Full text