Concepedia

Identification of the degradation state for condition-based maintenance of insulated gate bipolar transistors: A self-organizing map approach

Marco Rigamonti, Piero Baraldi, Enrico Zio, Allegra Alessi, Daniel Astigarraga, Ainhoa Galarza

Microelectronics Reliability · 2016 · 19 citations · 33 references

DOI

Concepts

References

33

Pattern Recognition and Machine Learning

Journal of Electronic Imaging · 2007 · 22.1K citations

, , +14

Pattern Recognition and Machine Learning

Kybernetes · 2007 · 8.4K citations

, , +14

An Industry-Based Survey of Reliability in Power Electronic Converters

Shaoyong Yang, A.T. Bryant, Philip Mawby et al. · IEEE Transactions on Industry Applications · 2011 · 1.9K citations · Full text

, , +16

Selected failure mechanisms of modern power modules

Mauro Ciappa · Microelectronics Reliability · 2002 · 969 citations

, , +13

The Relevance Vector Machine

Michael E. Tipping · 1999 · 875 citations

, , +15