European Design and Test Conference · 1995 · 20 citations · 12 references
EngineeringEfficient MethodData StructuresNon-robust SimulationReliability EngineeringTiming AnalysisFault AnalysisSystems EngineeringFault RecoveryParallel ComputingFailure DetectionAsynchronous CircuitsComputer EngineeringComputer ScienceDesign For TestingFault ManagementSoftware TestingFault InjectionBenchmark Circuits
We describe algorithms and data structures for accurate and efficient computation of path delay fault coverage. Our method uses an interval-based representation of consecutively numbered path delay faults. We describe a modified 2-3 tree data structure to store and manipulate these intervals to keep track of tested faults. Some results obtained using non-robust simulation of benchmark circuits suggest the viability of this approach. >
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Computational geometry. an introduction
Franco P. Preparata, Michael Ian Shamos · 1985 · 2.4K citations
Comparison of AC self-testing procedures
Z. Barzilai, Barry K. Rosen · International Test Conference · 1983 · 147 citations