Ultrashallow depth profiling using SIMS and ion scattering spectroscopy

Abstract

Abstract The accuracy of ultrashallow depth profiling was studied by secondary ion mass spectrometry (SIMS) and high‐resolution Rutherford backscattering spectroscopy (HRBS) to obtain reliable depth profiles of ultrathin gate dielectrics and ultrashallow dopant profiles, and to provide important information for the modeling and process control of advanced complimentary metal‐oxide semiconductor (CMOS) design. An ultrathin Si 3 N 4 /SiO 2 stacked layer (2.5 nm) and ultrashallow arsenic implantation distributions (3 keV, 1 × 10 15 cm −2 ) were used to explore the accuracy of near‐surface depth profiles measured by low‐energy O 2 + and Cs + bombardment (0.25 and 0.5 keV) at oblique incidence. The SIMS depth profiles were compared with those by HRBS. Comparison between HRBS and SIMS nitrogen profiles in the stacked layer suggested that SIMS depth profiling with O 2 + at low energy (0.25 keV) and an impact angle of 78° provides accurate profiles. For the As + ‐implanted Si, the HRBS depth profiles clearly showed redistribution in the near‐surface region. In contrast, those by the conventional SIMS measurement using Cs + primary ions at oblique incidence were distorted at depths less than 5 nm. The distortion resulted from a long transient caused by the native oxide. To reduce the transient behavior and to obtain more accurate depth profiles in the near‐surface region, the use of O 2 + primary ions was found to be effective, and 0.25 keV O 2 + at normal incidence provided a more reliable result than Cs + in the near‐surface region. Copyright © 2007 John Wiley & Sons, Ltd.