Concepedia

Basic requirements for quantitative SIMS analysis using cesium bombardment and detection of MCs+ secondary ions

K. Wittmaack

Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 1992 · 63 citations · 16 references

DOI

Concepts

References

16

Evaluation of a cesium positive ion source for secondary ion mass spectrometry

H. A. Storms, Kenneth F. Brown, John D. Stein · Analytical Chemistry · 1977 · 347 citations

, , +11

A new secondary ion mass spectrometry technique for III-V semiconductor compounds using the molecular ions CsM+

Yijie Gao · Journal of Applied Physics · 1988 · 282 citations

, , +16

Mechanism of the SIMS matrix effect

V. R. Deline, W. Katz, C. A. Evans et al. · Applied Physics Letters · 1978 · 233 citations

, , +10

Direct Evidence of Electron Tunneling in the Ionization of Sputtered Atoms

Ming L. Yu, N. D. Lang · Physical Review Letters · 1983 · 226 citations

, , +15

Secondary ion mass spectrometry (SIMS VI)

A. Benninghoven, Andreas Huber, H. W. Werner · Analytica Chimica Acta · 1988 · 211 citations

, , +6