W. Katz

Mechanism of the SIMS matrix effect

V. R. Deline, W. Katz, C. A. Evans et al. · Applied Physics Letters · 1978 · 231 citations

Engineering, Biological Mass Spectrometry, Ion-yield Variations +21

Surface cesium concentrations in cesium-ion-bombarded elemental and compound targets

J. E. Chelgren, W. Katz, V. R. Deline et al. · Journal of Vacuum Science and Technology · 1979 · 59 citations

Differential Sputtering Effects, Engineering, Electron Spectroscopy +12

Ge diffusion at Ge/GaAs heterojunctions

Kandula V. N. Sarma, R. J. Dalby, Kenneth Rose et al. · Journal of Applied Physics · 1984 · 45 citations

Semiconductors, Wide-bandgap Semiconductor, Diffusion Heat Treatment +12

Fundamentals of Secondary Ion Mass Spectrometry

W. Katz, John G. Newman · MRS Bulletin · 1987 · 41 citations

Natural Sciences, Mass Spectrometry, Analytical Chemistry +5

Thermal Oxidation of Sputtered Silicon Carbide Thin Films

W. Lu, A. J. Steckl, T. Paul Chow et al. · Journal of The Electrochemical Society · 1984 · 39 citations

Materials Engineering, Materials Science, Semiconductors +15