Quantitative measurements of the mass distribution in thin films during electrotransport experiments

Electromigration Damage in Aluminum Film Conductors

M. J. Attardo, R. Rosenberg · Journal of Applied Physics · 1970 · 264 citations

Natural Sciences, Materials Engineering, Materials Science +16

Electromigration in Thin Al Films

I. A. Blech, Eugene S. Meieran · Journal of Applied Physics · 1969 · 188 citations

Natural Sciences, Materials Engineering, Materials Science +12

RESISTANCE MONITORING AND EFFECTS OF NONADHESION DURING ELECTROMIGRATION IN ALUMINUM FILMS

R. Rosenberg, L. Berenbaum · Applied Physics Letters · 1968 · 154 citations

Natural Sciences, Materials Engineering, Materials Science +17

DIRECT TRANSMISSION ELECTRON MICROSCOPE OBSERVATION OF ELECTROTRANSPORT IN ALUMINUM THIN FILMS

I. A. Blech, Eugene S. Meieran · Applied Physics Letters · 1967 · 135 citations

Natural Sciences, Electrical Engineering, Materials Science +9

Dependence of Electromigration-Induced Failure Time on Length and Width of Aluminum Thin-Film Conductors

B. Agarwala, M. J. Attardo, A. P. Ingraham · Journal of Applied Physics · 1970 · 119 citations

Natural Sciences, Electrical Engineering, Materials Science +17