IEEE Transactions on Electron Devices · 1990 · 64 citations · 21 references
EngineeringElectrical EngineeringMicroelectronicsSemiconductor DevicesTransport PhenomenaDevice CharacterizationDevice ModelingDevice SimulationElectronic Transport ModelingIntegrated Circuit DesignNanoelectronicsCarrier Velocity OvershootDevice OptimizationHydrodynamic Device ModelingMetal-oxide-semiconductor Field-effect Transistor ModelingMosfet ModelingOvershootSmall-signal ModelingTwo-dimensional Hydrodynamic Modeling
Using a two-dimensional hydrodynamic energy model incorporating nonstationary electron dynamics and nonisothermal electron transport (which characterizes submicron-gate MODFETs), the main physical phenomena that govern the device performance at 300 K are highlighted. This covers velocity overshoot effects, stationary-domain formation, and real space transfer. The model is then used systematically to predict the precise values of the small-signal parameters for different bias conditions. The potential performance improvement achieved by reducing the gate length below 0.2 mu m is investigated. It is shown that improvement in transconductance is achieved through gate-length reduction if a severe restriction on the aspect ratio is respected.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>
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Electron density of the two-dimensional electron gas in modulation doped layers
Kwyro Lee, M. S. Shur, Timothy J. Drummond et al. · Journal of Applied Physics · 1983 · 134 citations · Full text