IEEE Journal of Solid-State Circuits · 1999 · 14 citations · 5 references
EngineeringElectrical EngineeringMicroelectronicsSemiconductor DevicesCmos Circuit DesignComplementary Metal-oxide-semiconductor TechnologyMemory DevicesMemory Subsystem DesignMetal-oxide-semiconductor Field-effect TransistorsBody EffectCharge Pump DesignCharge PumpingFlash MemoryFlash Memory DevicesMemory Circuit DesignNon-volatile Memory DesignPump Efficiency
A 29-mm/sup 2/, 16-Mb divided bitline NOR (DINOR) flash memory is fabricated using 0.25-/spl mu/m triple-well three-layer-metal CMOS technology. Read access time is 72 ns at 1.8 V. A poly diode charge-pump technique improves pump efficiency and eliminates the body effect problem.
5
Lateral Polysilicon p‐n Diodes
M. Dutoit, F. Sollberger · Journal of The Electrochemical Society · 1978 · 55 citations
A 3.3 V-only 16 Mb DINOR flash memory
S. Kobayashi, M. Mihara, Y. Miyawaki et al. · 2002 · 34 citations
Engineering, Computer Engineering, Electrical Engineering +16
A 5-V-only 16-Mb flash memory with sector erase mode
T. Jinbo, H. Nakata, K. Hashimoto et al. · IEEE Journal of Solid-State Circuits · 1992 · 34 citations
Engineering, Computer Engineering, Electrical Engineering +12