Study Of Single-event-upsets In PAL16R8

Rate prediction for single event effects-a critique

E.L. Petersen, J.C. Pickel, James H. Adams et al. · IEEE Transactions on Nuclear Science · 1992 · 279 citations

Engineering, Electrical Engineering, Circuit Theory +12

Radiation effects on microelectronics in space

J. R. Srour, J.M. McGarrity · Proceedings of the IEEE · 1988 · 277 citations

Engineering, Aerospace Engineering, Electrical Engineering +17

Heavy ion test results on memories

R. Ecoffet, M. Labrunee, S. Duzellier et al. · 2003 · 43 citations

Engineering, Computer Engineering, Electrical Engineering +14

Lateral charge transport from heavy-ion tracks in integrated circuit chips

J. A. Zoutendyk, H. R. Schwartz, Leland R. Nevill · IEEE Transactions on Nuclear Science · 1988 · 42 citations

Engineering, Electrical Engineering, Physics +17

Single-Event Upset (SEU) Model Verification and Threshold Determination Using Heavy Ions in a Bipolar Static RAM

J. A. Zoutendyk, L. S. Smith, George Soli et al. · IEEE Transactions on Nuclear Science · 1985 · 27 citations

Engineering, Electrical Engineering, Low-power Design +13