J. Barak

Updated NIEL calculations for estimating the damage induced by particles and γ-rays in Si and GaAs

A. Akkerman, J. Barak, M. B. Chadwick et al. · Radiation Physics and Chemistry · 2001 · 123 citations

Semiconductor Technology, Physics, Applied Physics +4

Ion and electron track-structure and its effects in silicon: model and calculations

A. Akkerman, J. Barak, Dimitris Emfietzoglou · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 2004 · 86 citations

Ion Implantation, Engineering, Physics +5

Electron and Ion Tracks in Silicon: Spatial and Temporal Evolution

Michael Murat, A. Akkerman, J. Barak · IEEE Transactions on Nuclear Science · 2008 · 77 citations

Electrical Engineering, Engineering, Physics +14

Anthology of the Development of Radiation Transport Tools as Applied to Single Event Effects

Robert A. Reed, Robert A. Weller, A. Akkerman et al. · IEEE Transactions on Nuclear Science · 2013 · 65 citations

Radiation Transport Tools, Engineering, Radiation Exposure +21

Ion-track structure and its effects in small size volumes of silicon

A. Akkerman, J. Barak · IEEE Transactions on Nuclear Science · 2002 · 60 citations

Ion-track Structure, Electrical Engineering, Energy Deposition +12