Updated NIEL calculations for estimating the damage induced by particles and γ-rays in Si and GaAs - Concepedia

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Updated NIEL calculations for estimating the damage induced by particles and γ-rays in Si and GaAs

123

Citations

26

References

2001

Year

A. Akkerman, J. Barak, M. B. Chadwick, J. Levinson, Michael Murat, Y. Lifshitz

Radiation Physics and Chemistry

Semiconductor TechnologyPhysicsApplied PhysicsSingle Event EffectsNiel CalculationsSemiconductor Device FabricationSemiconductor Device

References

	Year	Citations

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