Statistics
Publications
3
Citations
419
H-Index
3
Active since
1987
Affiliations
Leland R. Nevill is an author at Micron (United States) specializing in engineering, computer engineering, and microelectronics.
Publications per year
1987–2008
3
3
Bit error rate in NAND Flash memories
Neal Mielke, Todd A. Marquart, Ning Wu et al. · 2008 · 355 citations
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