IEEE Transactions on Components Hybrids and Manufacturing Technology · 1993 · 72 citations · 4 references
EngineeringElectrical EngineeringAnalog ElectronicsMicroelectronicsSystem-on-chip DesignIntegrated Circuit DesignLow-noise Circuit DesignNoise In Electronic DevicesNoise In Semiconductor DevicesNoise Reduction DesignNoise TestingCapacitance ReductionDevice Noise CharacterizationDifferential NoiseInductance MeasurementIntegrated Circuit NoiseNoise AnalysisNoise Analysis In Integrated CircuitsOn-chip Decoupling
The experimental procedures and test vehicles used for the characterization of the decoupling capacitor efficiency in reducing the power supply differential switching noise of the multichip-module (MCM) package structure employed in the IBM ES/9000 system are described. The experimental results are summarized for various switching elements. It is demonstrated that careful design of the test vehicles, tester systems, and probes makes the accurate measurement of Delta-1 noise feasible. Experimental results on the BOBCAT tester show that the decoupling capacitor efficiency in reducing the peak of the differential Delta-1 noise is 50-67%. This efficiency can be increased by reducing the effective inductance in the decoupling capacitor current return path.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>
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Microelectronics Packaging Handbook
Rao Tummala, Eugene J. Rymaszewski, Y. C. Lee · Journal of Electronic Packaging · 1989 · 535 citations