2003 · 55 citations · 7 references
EngineeringComputer EngineeringElectrical EngineeringFault ToleranceFault-tolerant ComputingMicroelectronicsBuilt-in Self-testDesign For TestabilityDigital Signal ProcessingFault DetectionHardware Error DetectionLogic BistPath Delay AnalysisTransition Detection
This paper presents a practical case-study of using DFT techniques for speed-grading the Motorola MPC7455, a 1 GHz+ microprocessor. The effectiveness of transition fault detection, path-delay AC-scan patterns and array BIST is compared with that of functional patterns for speed-grading the parts. We discuss the capabilities and challenges of using the DFT methods based on production data.
7
The PowerPC 603 microprocessor: an array built-in self test mechanism
C. Hunter, J. Slaton, J. Eno et al. · 2002 · 37 citations
Engineering, Computer Engineering, Electrical Engineering +17
DFT advances in the Motorola's MPC7400, a PowerPC/sup TM/ G4 microprocessor
C. Pyron, M. Alexander, J. Golab et al. · 2003 · 23 citations