IEEE Transactions on Components Hybrids and Manufacturing Technology · 1990 · 17 citations · 10 references
EngineeringElectrical EngineeringCircuit TheoryElectromagneticsMicrowave EngineeringInterconnect TechnologyMicrostrip CircuitsMicrowave Integrated CircuitsMicrowave MeasurementsMicrowave PackagingMicrowave Transmission LinesDielectric ConstantElectrical PropertiesInterconnect Capacitance ModelingInterconnect Inductance ModelingInterconnect ModelingInterconnect Resistance ModelingReflectivityTransmission Line Modeling
A simple model is presented based on closed-form analytical approximations for the resistance, capacitance, inductance, and conductance of a generic microstrip interconnect. Working in the frequency domain, all the low-frequency lumped circuit and high-frequency transmission line properties can be calculated. As examples, this model is applied to high-frequency reflectivity measurements on Teflon and FR4 printed circuit board microstrips. Agreement to better than 5% up to 1 GHz is obtained by using a dielectric constant of 2.20 and dissipation factor of 0.004 for the Teflon boards and a dielectric constant of 4.9 at 1 MHz with a constant dissipation factor of 0.022 for the FR4 microstrips. This model enables packaging engineers to evaluate the possibilities of an interconnect technology very simply on their personal computers (PCs).< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>
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Microelectronics Packaging Handbook
Rao Tummala, Eugene J. Rymaszewski, Y. C. Lee · Journal of Electronic Packaging · 1989 · 535 citations
R.A. Pucel, D. Massé, C.P. Hartwig · IEEE Transactions on Microwave Theory and Techniques · 1968 · 528 citations