2009 · 38 citations · 12 references
EngineeringComputer EngineeringElectrical EngineeringMicroelectronicsSemiconductor DevicesDesign For TestabilityDevice CharacterizationElectrical System TestingFault DetectionHardware DebuggingTransient AnalysisCircuit Transient AnalysisSiliconSilicon DebuggingTransient Detection
Voltage transients from circuit activity impact operation, testing and debug of complex designs. This paper describes a system which enables voltage transient detection and a capability to induce voltage transients in a controlled manner. Usage models and silicon results are described, along with limitations and future options for improvements.
12
A case study of ir-drop in structured at-speed testing
J. Saxena, Kenneth M. Butler, Vinay Jayaram et al. · 2004 · 403 citations
Engineering, Computer Engineering, Electrical Engineering +14