On detecting single and multiple bridging faults in CMOS circuits using the current supply monitoring method

Abstract

Several examples are presented to illustrate the limitations of current supply monitoring (CSM). Constraints on a circuit on a circuit and its test environment which guide the use of CSM are described. Under these constraints it is formally shown that all single irredundant bridging faults can be detected by single vector tests and that a test vector which detects a single bridging fault f/sub 1/ also detects all multiple bridging faults that contain f/sub 1/.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">&gt;</ETX>