K.-J. Lee

Design and test rules for CMOS circuits to facilitate IDDQ testing of bridging faults

K.-J. Lee, M.A. Breuer · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 1992 · 56 citations

Engineering, Computer Engineering, Electrical Engineering +15

A universal test sequence for CMOS scan registers

K.-J. Lee, M.A. Breuer · 2002 · 44 citations

Engineering, Computer Engineering, Electrical Engineering +15

On the charge sharing problem in CMOS stuck-open fault testing

K.-J. Lee, M.A. Breuer · 2002 · 26 citations

Engineering, Computer Engineering, Electrical Engineering +9

On detecting single and multiple bridging faults in CMOS circuits using the current supply monitoring method

K.-J. Lee, M.A. Breuer · 2002 · 18 citations

Engineering, Computer Engineering, Electrical Engineering +12

A new method for assigning signal flow directions to MOS transistors

K.-J. Lee, Ratnesh Gupta, M.A. Breuer · 2002 · 17 citations

Engineering, Computer Engineering, Electrical Engineering +11