Applied Physics Letters · 2006 · 23 citations · 12 references
EngineeringMicroscopyPiezoelectric Force MicroscopyThin Film Process TechnologyMicroscopy MethodNanometrologyPiezoelectric MaterialEpitaxial GrowthThin Film ProcessingMaterials ScienceGrain Boundary EffectsNanotechnologyPiezoelectricityMicrostructureProbe Storage ApplicationsScanning Probe MicroscopySurface ScienceApplied PhysicsScanning Force MicroscopyDomain FormationThin FilmsDomain Growth
Tip traveling and grain boundary effects have been investigated by varying the voltage pulse width on Pb(Zr0.25Ti0.75)O3 films using piezoelectric force microscopy. Depending on pulse width, the authors distinguish three regions of domain formation. It was found that grain boundaries act as electric shield, which prevents domain growth across grains. Domain growth across grains was mainly due to the tip traveling effect. Calculations based on the authors’ model matched well with experimental data.
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