IEEE Transactions on Nuclear Science · 2008 · 20 citations · 9 references
EngineeringAerospace EngineeringMaterials ScienceAircraft StructuresMicroelectromechanical SystemsSensorsMems CharacterizationMems SensorsMems TestingMicroelectromechanical SensorsStrain MeasurementStrain SensorsAircraft Structural MonitoringCrystalline SiliconIrradiation ConditionsPiezoresistive MaterialsProton Irradiation ResistanceRadiation EffectsSiliconSingle-crystal Silicon
A microelectromechanical system (MEMS) strain gauge constructed from single-crystalline silicon has been developed for application in aircraft structural-health-monitoring. The effects of proton irradiation on the piezoresistive elements of the silicon strain gauges are examined. Degradation in the piezoresistive response at applied strains above 2000 microstrain is observed.
9
Single-event effects in avionics
E. Normand · IEEE Transactions on Nuclear Science · 1996 · 414 citations
Engineering, Aerospace Engineering, Computer Engineering +16
The effects of radiation on MEMS accelerometers
A.R. Knudson, S. Büchner, P.T. McDonald et al. · IEEE Transactions on Nuclear Science · 1996 · 78 citations
Engineering, Electrical Engineering, Mechanical Engineering +17