Single-Event Effect Mitigation in Switched-Capacitor Comparator Designs

Abstract

<para xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> A radiation-hardened-by-design (RHBD) technique is described for reducing errors due to single-event effects at the floating input nodes of a switched-capacitor comparator. The technique is shown to significantly outperform the alternative “brute force” design choice of increasing capacitor size. </para>