EngineeringComputer EngineeringElectrical EngineeringMemoryMicroelectronicsSemiconductor DevicesDevice CharacterizationDevice ReliabilityMemory DevicesMemory Subsystem DesignMemory Circuit DesignNon-volatile Memory DesignRadiation-hardened MemoryRadiation-hardened Memory Devices
SEE sensitivity to protons and heavy ions is examined with several 2 Gb DDR2 SDRAM device types. Upsets in memory elements as well as in control circuit sections have been measured.