Electrical characterization of packaging environment using switching noise generating vehicle

Abstract

A CMOS test vehicle which generates simultaneous switching noise programmably is described. It is effective to evaluate noise level under a practical packaging environment, such as single-chip packages or multichip modules in any power/ground structures. Measured data can be used to verify the effective inductance of the package electrical model.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">&gt;</ETX>