IEEE Transactions on Very Large Scale Integration (VLSI) Systems · 2006 · 48 citations · 11 references
EngineeringComputer EngineeringElectrical EngineeringCircuit TheoryMicroelectronicsVlsi DesignCmos Circuit DesignIntegrated Circuit DesignNoise In Electronic DevicesNoise In Semiconductor DevicesSignal IntegrityVery-large-scale Integration LayoutCoupled Interconnect ModelingCrosstalkDecouplingIntegrated Circuit NoiseInterconnect ModelingMutual InductanceRlc CircuitsShielding
On-chip interconnect delay and crosstalk noise have become significant bottlenecks in the performance and signal integrity of deep submicrometer VLSI circuits. A crosstalk noise model for both identical and nonidentical coupled resistance-inductance-capacitance (RLC) interconnects is developed based on a decoupling technique exhibiting an average error of 6.8% as compared to SPICE. The crosstalk noise model, together with a proposed concept of effective mutual inductance, is applied to evaluate the effectiveness of the shielding technique.
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Yungseon Eo, Jong‐In Shim, W.R. Eisenstadt · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 2002 · 32 citations