Physica Scripta · 2004 · 41 citations · 3 references
EngineeringElectrical EngineeringMicroelectronicsSemiconductor DevicesSemiconductor MaterialsDevice CharacterizationDevice ModelingDevice SimulationMetal-oxide-semiconductor Field-effect TransistorsNonlinear Circuit AnalysisSemiconductor PhysicsDiode Current-voltage CharacteristicsDiode ModelingGate Oxide Thickness EffectsLayer Thickness EffectsSemiconductor Device ModelingTransistor Nonlinearity
A new type of nanometer scale nonlinear device, called self-switching device (SSD) is realized by tailoring the boundary of a narrow semiconductor channel to break its symmetry. An applied voltage V not only changes the potential profile along the channel direction, but also either widens or narrows the effective channel width depending on the sign of V. This results in a strongly nonlinear I-V characteristic, resembling that of a conventional diode. Because the structure resembles a diode-connected FET (gate and drain shorted), we have modeled the device as a sideways turned FET, so that the trench width t corresponds to insulator thickness tox and conducting layer thickness Z (inside the semiconductor!) corresponds to channel width W.
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The Physics of Semiconductor Devices
Andrew Grant · Physics Bulletin · 1978 · 795 citations