Concepedia

Publication | Closed Access

Modeling and simulation of resistivity of nanometer scale copper

DOI

40

Citations

9

References

2005

Year

A. Emre Yarımbıyık, Harry A. Schafft, Richard A. Allen, Mona Zaghloul, David L. Blackburn
Microelectronics Reliability

References

YearCitations

Page 1