David L. Blackburn - Concepedia

Author

David L. Blackburn

National Institute of Standards and Technology

Also Known As

David Blackburn, David L Blackburn, David L. Blackburn

Publications

967

Citations

H-Index

Concepts

All Affiliations

National Institute of Standards and Technology

About

David L. Blackburn is an author at National Institute of Standards and Technology specializing in engineering, electrical engineering, and microelectronics.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	13	14	842
2	Electrical Engineering	13	13	822
3	Applied Physics	5	5	201
4	Computer Engineering	3	3	139
5	Education	1	1	56

David L. Blackburn

Publications

871

Citations

H-Index

Page 1

	Year	Citations
An analytical model for the steady-state and transient characteristics of the power insulated-gate bipolar transistor Allen R. Hefner, David L. Blackburn Solid-State Electronics Device ModelingElectrical EngineeringEngineeringPower DeviceTransient Characteristics	1988	255
Transient Thermal Response Measurements of Power Transistors David L. Blackburn, Frank F. Oettinger IEEE Transactions on Industrial Electronics and Control Instrumentation Device ModelingElectrical EngineeringEngineeringPulsed Heating CurvePower Transistors	1975	102
Thermal Component Models for Electrothermal Network Simulation Allen R. Hefner, David L. Blackburn IEEE Transactions on Components and Packaging Technologies Electrical EngineeringEngineeringThermal Component ModelsNumerical SimulationThermal Management	1994	75
Semiconductor measurement technology: Thermal resistance measurements Frank F. Oettinger, David L. Blackburn Electrical EngineeringSemiconductor Measurement TechnologyEngineeringApplied PhysicsThermal Analysis	1990	61
A Performance Trade-Off for the Insulated Gate Bipolar Transistor: Buffer Layer Versus Base Lifetime Reduction Allen R. Hefner, David L. Blackburn IEEE Transactions on Power Electronics Device ModelingElectrical EngineeringSemiconductor DeviceEngineeringVlsi Design	1987	56
Power MOSFET temperature measurements David L. Blackburn, D.W. Berning Electrical EngineeringEngineeringThermographyMeasurementTemperature Measurement	1982	56
An Electrical Technique for the Measurement of the Peak Junction Temperature of Power Transistors David L. Blackburn Reliability physics EngineeringPower ElectronicsJunction TemperaturePeak Junction TemperatureThermal Analysis	1975	41
Modeling and simulation of resistivity of nanometer scale copper A. Emre Yarımbıyık, Harry A. Schafft, Richard A. Allen, Microelectronics Reliability Electrical EngineeringEngineeringResistorSpecific ResistanceNanotechnology	2005	40
Turn-Off Failure of Power MOSFET's David L. Blackburn IEEE Transactions on Power Electronics Electrical EngineeringPower MosfetEngineeringPower DeviceBias Temperature Instability	1987	40
Stable hot spots and second breakdown in power transistors Philip L. Hower, David L. Blackburn, Frank F. Oettinger, Device ModelingStable Hot SpotsElectrical EngineeringHot Spot ModeEngineering	1976	39

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