Nanotechnology · 2008 · 41 citations · 45 references
Natural SciencesBiophysicsMaterials ScienceBiosensorsNanomaterialsSurface ScienceAtomic Force MicroscopyNanostructured SurfacesNanotubesScanning Probe MicroscopySuper-resolution MicroscopySurface MicroscopyAtomic Force Microscopy Image ResolutionHigh-resolution ImagingLabel-free DetectionLateral ResolutionSurface ContrastSurface PotentialSurface Potential MappingSurface Potential Measurement
The resolution of scanning surface potential microscopy (SSPM) is mainly limited by non-local electrostatic interactions due to the finite probe size. Here we present high resolution surface potential imaging with ultrasharp and high aspect ratio carbon nanotube (CNT) atomic force microscopy (AFM) probes fabricated via dielectrophoresis. Enhancement of surface potential contrast by several factors is reported for integrated circuit structures and purple membrane fragments for these CNT AFM probes as compared to conventional probes. In particular, ultrahigh lateral resolution (∼2 nm) surface potential images of self-assembled bacteriorhodopsin proteins are reported at ambient conditions, with the implication of label-free protein detection by SSPM techniques.
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M. Nonnenmacher, M. O’Boyle, H. K. Wickramasinghe · Applied Physics Letters · 1991 · 2.3K citations
Natural Sciences, Materials Engineering, Materials Science +17
Resolution and contrast in Kelvin probe force microscopy
Heiko O. Jacobs, P. Leuchtmann, O.J. Homan et al. · Journal of Applied Physics · 1998 · 469 citations
Accuracy and resolution limits of Kelvin probe force microscopy
Ulrich Zerweck, Christian Loppacher, Tobias Otto et al. · Physical Review B · 2005 · 434 citations