2002 · 20 citations · 9 references
EngineeringComputer EngineeringElectrical EngineeringComputer ArchitectureMicroelectronicsRadiation MeasurementDesign For TestabilityDevice ReliabilityHardware Fault ToleranceProcessor Core DesignProcessor MicroarchitectureRadiation HardeningComponent-level Radiation TestingIrradiation ConditionsProcessor FaultsRadiation EffectsRadiation-hardened Integrated CircuitsRadiation-tolerant ElectronicsSingle Event Upset Modeling
Experimental single event upset characterization of the Pentium(R) MMX and Celeron(R) microprocessors using proton irradiation is presented. Results are compared with previous testing on the Pentium(R) MMX and Pentium(R) II microprocessors.
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