David M. Hiemstra

LET spectra of proton energy levels from 50 to 500 MeV and their effectiveness for single event effects characterization of microelectronics

David M. Hiemstra, E. W. Blackmore · IEEE Transactions on Nuclear Science · 2003 · 75 citations

Natural Sciences, Nuclear Engineering, Physics +14

Single event upset characterization of the Pentium(R) MMX and Pentium(R) II microprocessors using proton irradiation

David M. Hiemstra, A. Baril · IEEE Transactions on Nuclear Science · 1999 · 40 citations

Engineering, Computer Engineering, Computer Science +15

Single Event Upset Characterization of the Virtex-5 Field Programmable Gate Array Using Proton Irradiation

David M. Hiemstra, George Battiston, Prab Gill · 2010 · 34 citations

Engineering, Computer Engineering, Electrical Engineering +16

Single Event Upset Characterization of the Virtex-4 Field Programmable Gate Array Using Proton Irradiation

David M. Hiemstra, F. Chayab · 2006 · 31 citations

Engineering, Computer Engineering, Electrical Engineering +15

Single Event Upset Characterization of the Kintex-7 Field Programmable Gate Array Using Proton Irradiation

David M. Hiemstra, Valeri Kirischian · 2014 · 30 citations

Engineering, Computer Engineering, Electrical Engineering +16