IEEE Transactions on Nuclear Science · 1999 · 40 citations · 7 references
EngineeringComputer EngineeringComputer ScienceComputer ArchitectureMicroelectronicsRadiation MeasurementDevice ReliabilityProcessor Core DesignProcessor MicroarchitectureRadiation HardeningComponent-level Radiation TestingIrradiation ConditionsRadiation EffectsRadiation Hardened Computer ArchitectureRadiation-hardened MicroprocessorsRadiation-tolerant ElectronicsSingle Event EffectsSingle Event Upset Modeling
Experimental single event upset characterization of the Pentium(R) MMX and Pentium(R) II microprocessors using proton irradiation are presented. Results show the Pentium(R) II processor core cross-section is ten times that of the MMX.
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