2003 · 15 citations · 7 references
EngineeringElectrical EngineeringElectronic MaterialsMicroelectronicsSemiconductor DevicesDevice CharacterizationDevice ModelingDevice ReliabilityDevice ScalingDevice SimulationDevice Scaling EffectsExperimental Results InterpretationScaling EffectsScaling Theory
The performance of multiple-cell devices is limited by a redistribution of current during turn-off because minor differences between the otherwise identical cells seem to become important. A simple model based on Gaussian statistics gives a quantitative explanation of this phenomenon for the first time. For the example of a gate turn-off thyristor (GTO) it leads to an approximate square-root scaling of turn-off current with device size. Good agreement with experimental results is found. The model is not GTO-specific and may cover other devices as well.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>
7