IEEE Design & Test of Computers · 2012 · 51 citations · 11 references
EngineeringElectrical EngineeringAnalog ElectronicsTest DevelopmentAdaptive Test ConstructionAdaptive TestingAnalog Integrated CircuitsBuilt-in Self-testDesign For TestabilityDevice CharacterizationAnalog Built-in Self-testAnalog TestabilityBuilt-in Self-test For Analog CircuitsCmos Analog Integrated CircuitsLow-cost Built-in Self-testMixed-signal Built-in Self-testMixed-signal Test
Adaptive test is a promising approach for test cost reduction. This article presents an adaptive test scheme for analog circuits that capitalizes on alternate test to achieve a low cost for the majority of fabricated devices. The small fraction of devices for which the alternate test decision may be prone to error are identified and further action is taken.
11
Defect Filter for Alternate RF Test
Haralampos‐G. Stratigopoulos, Salvador Mir, Erkan Acar et al. · 2009 · 66 citations
Engineering, Computer Engineering, Electrical Engineering +12