IEEE Transactions on Microwave Theory and Techniques · 1992 · 11 citations · 21 references
EngineeringElectrical EngineeringCircuit TheoryDesign OptimizationMicroelectronicsDevice CharacterizationDevice ModelingIntegrated Circuit DesignYield AnalysisYield ForecastingYield PredictionEquivalent Circuit AnalysisEquivalent Circuit ModelingMetal-oxide-semiconductor Field-effect Transistor ModelingState-of-the-art ReviewStatistical Yield ModelingYield Enhancement
The state-of-the-art criteria and tools for an efficient development of mass producible MMICs are discussed with reference to a specific development philosophy. The available yield evaluation systems are then critically analyzed and the results of a systematic functional yield evaluation performed on a large number of monolithic circuit components are reported. A statistically meaningful database (including both FET equivalent circuit and S parameters) developed for parametric yield evaluation and yield-driven design centering is described. Through a significant example, the possibility is demonstrated of drastically improving the accuracy of the parametric circuit yield forecasts by using a small set of mutually uncorrelated process dependent parameters and by making reference to a physically based semiempirical FET model.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>
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