Statistical Yield Modeling
Statistical Yield Modeling is a computational framework that belongs to the class of yield estimation methods, distinguished by its use of statistical inference and probabilistic models to quantify and predict agricultural or industrial output based on observed input variables and historical data.
223
Publications
10.9K
Citations
695
Authors
329
Institutions
Publications per year
2017–2026
60
223
Integrated circuit yield statistics
C.H. Stapper, F.M. Armstrong, K. Saji · Proceedings of the IEEE · 1983 · 405 citations
Engineering, Electrical Engineering, Manufacturing Engineering +15
1–5 of 223
695
5
h-index
4
h-index
3
h-index
3
h-index
3
h-index
1–5 of 695
329
IBM (United States)
Armonk, United States
11 h-index
20 publications
1.8K citations
China Agricultural University
Beijing, China
7 h-index
23 publications
1.5K citations
Texas Instruments (United States)
Dallas, United States
6 h-index
23 publications
1.2K citations
Kansas State University
Manhattan, United States
5 h-index
14 publications
490 citations

Cornell University
Ithaca, United States
5 h-index
6 publications
1.2K citations
University of Illinois Urbana-Champaign
Urbana, United States
5 h-index
21 publications
1.4K citations

Chinese Academy of Sciences
Beijing, China
5 h-index
6 publications
330 citations
University of Missouri
Columbia, United States
4 h-index
5 publications
155 citations
1–8 of 329
11 publications · 937 citations
11
h-index
10 publications · 404 citations
10
h-index
7 publications · 488 citations
7
h-index
6 publications · 167 citations
6
h-index
6 publications · 417 citations
6
h-index
1–5