Concepedia

Real time spectroscopic ellipsometry of Ag/ZnO and Al/ZnO interfaces for back-reflectors in thin film Si:H photovoltaics

Lila R. Dahal, Deepak Sainju, Nikolas J. Podraza, Sylvain Marsillac, R. W. Collins

Thin Solid Films · 2010 · 41 citations · 4 references

DOI

Concepts

References

4

Handbook of Ellipsometry

Thomas Schweizer · Applied Rheology · 2005 · 471 citations · Full text

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Rotating-compensator multichannel ellipsometry: Applications for real time Stokes vector spectroscopy of thin film growth

Joungchel Lee, P. I. Rovira, Ilsin An et al. · Review of Scientific Instruments · 1998 · 206 citations · Full text

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Evolution of the optical functions of thin-film aluminum: A real-time spectroscopic ellipsometry study

Hien V. Nguyen, Ilsin An, R. W. Collins · Physical review. B, Condensed matter · 1993 · 85 citations

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Effective dielectric response of nanostructured layers

Herbert Wormeester, E. Stefan Kooij, Bene Poelsema · physica status solidi (a) · 2008 · 35 citations · Full text

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