Lila R. Dahal

Real time spectroscopic ellipsometry of Ag/ZnO and Al/ZnO interfaces for back-reflectors in thin film Si:H photovoltaics

Lila R. Dahal, Deepak Sainju, Nikolas J. Podraza et al. · Thin Solid Films · 2010 · 41 citations

Engineering, Materials Engineering, Materials Science +17

High-Speed Imaging/Mapping Spectroscopic Ellipsometry for In-Line Analysis of Roll-to-Roll Thin-Film Photovoltaics

Ambalanath Shan, M. Fried, György Juhász et al. · IEEE Journal of Photovoltaics · 2013 · 38 citations

Engineering, Materials Engineering, Materials Science +17

Applications of real-time and mapping spectroscopic ellipsometry for process development and optimization in hydrogenated silicon thin-film photovoltaics technology

Lila R. Dahal, Jian Li, Jason A. Stoke et al. · Solar Energy Materials and Solar Cells · 2014 · 25 citations

Engineering, Materials Engineering, Materials Science +16

Correlations Between Mapping Spectroscopic Ellipsometry Results and Solar Cell Performance for Evaluations of Nonuniformity in Thin-Film Silicon Photovoltaics

Lila R. Dahal, Zhiquan Huang, Dinesh Attygalle et al. · IEEE Journal of Photovoltaics · 2012 · 20 citations

Engineering, Materials Engineering, Materials Science +17

Quantum efficiency simulations from on-line compatible mapping of thin-film solar cells

Puruswottam Aryal, Jie Chen, Zhiquan Huang et al. · 2011 · 13 citations

Engineering, Materials Engineering, Materials Science +17