Applied Physics Letters · 1984 · 11 citations · 3 references
EngineeringElectrical EngineeringMaterials ScienceOptoelectronicsSemiconductor DevicesSemiconductor MaterialsDetector TechnologyLow-noise Circuit DesignNoise In Electronic DevicesNoise In Semiconductor DevicesPhotodetectorsSemiconductor DetectorsBit Error RateCarrier ConcentrationDynamic RangeHall EffectLiquid Phase EpitaxyNoise In PhotodetectorsPhotoconductive DetectorsReceiver Sensitivity
We demonstrate a low-noise Ga0.47In0.53As photoconductive detector prepared by liquid phase epitaxy using Fe compensation. A carrier concentration as low as 1.8×1013 cm−3 and a Hall mobility as high as 5390 cm2/Vs have been achieved. This has improved the noise current by 3.7 dB but reduced the gain (∼15) by 4.8 dB as compared to a high-mobility undoped detector grown by vapor phase epitaxy. The Fe incorporation has resulted in a factor of 2 improvement in the fall time (∼1.2 ns), which will reduce the amount of equalization required and hence improve the dynamic range of the detector. When tested in a receiver circuit containing a GaAs field-effect transistor front end at 1 Gb/s, the detector (no AR coating) showed a receiver sensitivity of −30.3 dBm at 1.55 μm for a bit error rate of 10−9.
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High purity InP and InGaAsP grown by liquid phase epitaxy
L. W. Cook, M. M. Tashima, N. Tabatabaie et al. · Journal of Crystal Growth · 1982 · 50 citations
Semi-insulating In0.53Ga0.47As by Fe doping
A. R. Clawson, D. P. Mullin, D.I. Elder et al. · Journal of Crystal Growth · 1983 · 21 citations