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Interface characterization of high-quality SrTiO3 thin films on Si(100) substrates grown by molecular beam epitaxy

DOI

36

Citations

6

References

2000

Year

J. Ramdani, Ravi Droopad, Zhiyi Yu, J. Curless, C. Overgaard, J. Finder, K. Eisenbeiser, J. A. Hallmark, W. J. Ooms, V. Kaushik,
Applied Surface Science

References

YearCitations

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