Current Applied Physics · 2011 · 22 citations · 13 references
Natural SciencesMaterials EngineeringMaterials ScienceElectronic MaterialsMaterials PhysicsThin FilmsCrystallization AnalysisSemiconductor Thin FilmsThin Film AnnealingThin Film Electrical PropertiesThin Film NucleationThin-film MaterialsAnnealing EffectsAnnealing Temperature EffectsAnnealing Time EffectsCrystallization In Thin FilmsElectrical PropertiesElectrical Properties AnalysisExcimer LasersThin-film Crystallization
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Rao Tummala · IEEE Transactions on Advanced Packaging · 2004 · 271 citations
Engineering, Computer Engineering, Electrical Engineering +17
John Knickerbocker, Paul Andry, L.P. Buchwalter et al. · IBM Journal of Research and Development · 2005 · 236 citations
Engineering, Computer Engineering, Electrical Engineering +17