Publication | Closed Access
Jones and Mueller matrices for specular reflection from a chiral medium: determination of the basic chiral parameters using the elements of the Mueller matrix and experimental configurations to measure the basic chiral parameters
10
Citations
10
References
1991
Year
Mueller MatrixOptical MaterialsEngineeringWave OpticNegative-index MetamaterialFresnel Reflection AmplitudesRayleigh ScatteringElectromagnetic MetamaterialsOptical PropertiesReflectionBasic Chiral ParametersComputational ElectromagneticsReflectanceReflectance ModelingPhysicsPolarization ImagingMueller MatricesNatural SciencesSpectroscopyGeometrical OpticWave ScatteringLight ScatteringWater Surface Reflectance
Using Fresnel reflection amplitudes, the Jones and Mueller matrices for reflection from a nonabsorbing gyrotropic medium are presented. Some basic chiral parameters are defined by using the elements of the Mueller matrix; experimental configurations are described.
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