Reflectance Modeling

Reflectance Modeling is a mathematical and computational modeling technique that characterizes a material’s surface reflectance by specifying the spatial, angular, and often spectral relationship between incident illumination and reflected radiance, in order to predict and synthesize its visual appearance in imaging and rendering applications.

5.2K

Publications

341.6K

Citations

11.7K

Authors

2.8K

Institutions

Publications per year

2017–2026

1.1K

Authors

11.7K

  1. RR
    Ravi Ramamoorthi

    University of California, Berkeley, United States

    58 publications · 5.7K citations

    39

    h-index

  2. AH
    Alan H. Strahler

    Boston University, United States

    44 publications · 9.8K citations

    34

    h-index

  3. CS
    Crystal Schaaf

    Boston University, United States

    43 publications · 7.6K citations

    33

    h-index

  4. PD
    Paul Debevec

    Creative Technologies (United States), United States

    32 publications · 5.6K citations

    27

    h-index

  5. KI
    Katsushi Ikeuchi

    The University of Tokyo, Japan

    28 publications · 3K citations

    22

    h-index

1–5 of 11.7K

Venues

  1. Remote Sensing of Environment

    313 publications · 40K citations

    100

    h-index

  2. ACM Transactions on Graphics

    TOG · 177 publications · 18.9K citations

    74

    h-index

  3. Applied Optics

    308 publications · 24.6K citations

    71

    h-index

  4. IEEE Transactions on Geoscience and Remote Sensing

    188 publications · 16.5K citations

    61

    h-index

  5. Journal of Geophysical Research Atmospheres

    JGR · 119 publications · 14K citations

    59

    h-index

1–5