Reflectance Modeling
Reflectance Modeling is a mathematical and computational modeling technique that characterizes a material’s surface reflectance by specifying the spatial, angular, and often spectral relationship between incident illumination and reflected radiance, in order to predict and synthesize its visual appearance in imaging and rendering applications.
5.2K
Publications
341.6K
Citations
11.7K
Authors
2.8K
Institutions
Publications per year
2017–2026
1.1K
Variants
Reflectance Modelling
Parents
5.2K
First operational BRDF, albedo nadir reflectance products from MODIS
Crystal Schaaf, Feng Gao, Alan H. Strahler et al. · Remote Sensing of Environment · 2002 · 2.6K citations
Raanan Fattal · ACM Transactions on Graphics · 2008 · 2.1K citations
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11.7K
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2.8K
Goddard Space Flight Center
Greenbelt, United States
56 h-index
298 publications
38.4K citations

Centre National de la Recherche Scientifique
Paris, France
53 h-index
434 publications
23.1K citations
University of Maryland, College Park
College Park, United States
50 h-index
197 publications
21.4K citations

Cornell University
Ithaca, United States
46 h-index
205 publications
26.2K citations
Columbia University
New York, United States
46 h-index
129 publications
15.1K citations
Boston University
Boston, United States
43 h-index
142 publications
39.3K citations

Chinese Academy of Sciences
Beijing, China
41 h-index
415 publications
15.7K citations
State Key Laboratory of Remote Sensing Science
Beijing, China
39 h-index
356 publications
15.5K citations
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313 publications · 40K citations
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TOG · 177 publications · 18.9K citations
74
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308 publications · 24.6K citations
71
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188 publications · 16.5K citations
61
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JGR · 119 publications · 14K citations
59
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