Concepedia

Characterization of amorphous aluminum oxide films prepared by the pyrosol process

A. Ortíz, J. C. Alonso, V. Pankov, A. Huanosta, É. Andrade

Thin Solid Films · 2000 · 45 citations · 16 references

DOI

Concepts

References

16

A semiautomatic algorithm for rutherford backscattering analysis

Lawrence Doolittle · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 1986 · 1K citations

, , +8

Infrared spectroscopic study of SiO<i>x</i> films produced by plasma enhanced chemical vapor deposition

P. G. Pai, S. S. Chao, Yasuo Takagi et al. · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 1986 · 799 citations

, , +17

<i>Encyclopedia of Applied Physics</i>

George L. Trigg, Steven J. Rothman, R. Benedek et al. · Physics Today · 1994 · 575 citations

, , +15

Microanalysis by the direct observation of nuclear reactions using a 2 MeV Van de Graaff

G. Amsel, J. P. Nadai, E. d'Artemare et al. · Nuclear Instruments and Methods · 1971 · 442 citations

, , +6

Chemical Vapor Deposition at Low Temperatures

J.C. Viguie · Journal of The Electrochemical Society · 1975 · 228 citations

, , +9