Thermal investigation of high power Optical Devices by transient testing

Gábor Farkas, Q. van Voorst Vader, A. Poppe, Gergő Bognár

IEEE Transactions on Components and Packaging Technologies · 2005 · 118 citations · 5 references

Concepts

Abstract

In case of opto-electronic devices, the power applied on the device leaves in a parallel heat and light transport, the interpretation of R/sub th/ is not obvious. The paper shows results of a combined optical and thermal measurement for the characterization of power light emitting diodes (LEDs). A model explaining R/sub th/ changes at different current levels is proposed.

References

5