On the theory of carrier number fluctuations in MOS devices

Physics of Semiconductor Devices

Samarth Jain, S. Radhakrishna · 1987 · 4.2K citations

Engineering, Electrical Engineering, Physics +12

Semiconductor surface physics

C. Hilsum · Journal of Physics and Chemistry of Solids · 1958 · 616 citations

Modified 1/f trapping noise theory and experiments in MOS transistors biased from weak to strong inversion—Influence of interface states

G. Reimbold · IEEE Transactions on Electron Devices · 1984 · 330 citations

Engineering, Electrical Engineering, Physics +16

Unified presentation of 1/f noise in electron devices: fundamental 1/f noise sources

A. van der Ziel · Proceedings of the IEEE · 1988 · 309 citations

Engineering, Electrical Engineering, Physics +16

A simple derivation of Reimbold's drain current spectrum formula for flicker noise in MOSFETs

G. Ghibaudo · Solid-State Electronics · 1987 · 56 citations

Engineering, Electrical Engineering, Microelectronics +14