Ex situ variable angle spectroscopic ellipsometry studies of electron cyclotron resonance etching of Hg1−xCdxTe

Savitzky-Golay Smoothing Filters

William H. Press, Saul A. Teukolsky · Computers in Physics · 1990 · 11.8K citations · Full text

Computing, Aerospace Engineering, Optics +2

Investigation of effective-medium models of microscopic surface roughness by spectroscopic ellipsometry

D. E. Aspnes, J. B. Theeten, F. Hottier · Physical review. B, Condensed matter · 1979 · 1K citations

Natural Sciences, Materials Engineering, Materials Science +17

Introduction to surface roughness and scattering

Choice Reviews Online · 1990 · 545 citations

Natural Sciences, Materials Engineering, Materials Science +10

Encyclopedia of materials characterization

John F. Watts · Materials & Design (1980-2015) · 1993 · 221 citations

Natural Sciences, Materials Engineering, Materials Science +12

Comparison Of Techniques For Measuring The Roughness Of Optical Surfaces

Jean M. Bennett · Optical Engineering · 1985 · 44 citations

Engineering, Materials Science, Metrology +16