J. B. Theeten - Concepedia

Author

J. B. Theeten

Ommic (France)

Also Known As

J B Theeten, J. B. THEETEN, J. B. Theeten, J.B Theeten, J.B. Theeten, Jean-Bernard Theeten

Publications

3.2K

Citations

H-Index

Concepts

All Affiliations

Ommic (France)Centre National de la Recherche Scientifique Philips (Netherlands)

About

J. B. Theeten is an author at Ommic (France) specializing in engineering, applied physics, and surface science.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	27	37	3K
2	Applied Physics	26	36	2.9K
3	Natural Sciences	7	7	1.2K
4	Chemistry	7	7	394
5	Chemical Engineering	3	3	132

J. B. Theeten

Publications

3.1K

Citations

H-Index

Page 1

	Year	Citations
Investigation of effective-medium models of microscopic surface roughness by spectroscopic ellipsometry D. E. Aspnes, J. B. Theeten, F. Hottier Physical review. B, Condensed matter EngineeringWettingMaxwell GarnettSoft MatterMicroscopic Roughness	1979	1K
Spectroscopic Analysis of the Interface Between Si and Its Thermally Grown Oxide D. E. Aspnes, J. B. Theeten Journal of The Electrochemical Society Optical MaterialsEngineeringThermally Grown OxideOptoelectronic DevicesOptical Characterization	1980	246
Optical properties and damage analysis of GaAs single crystals partly amorphized by ion implantation M. Erman, J. B. Theeten, Paul Chambon, Journal of Applied Physics Optical MaterialsEngineeringDielectric FunctionsGaas Single CrystalsIi-vi Semiconductor	1984	209
Dielectric function of Si-SiO2 and Si-Si3N4 mixtures D. E. Aspnes, J. B. Theeten Journal of Applied Physics Materials ScienceMaterials EngineeringDielectric FunctionEngineeringElectronic Materials	1979	133
Thermal nitridation of silicon dioxide films F.H.P.M. Habraken, A. E. T. Kuiper, Y. Tamminga, Journal of Applied Physics Materials ScienceMaterials EngineeringOxide HeterostructuresArgon Ion SputteringHigh Temperature Materials	1982	118
Optical Properties of the Interface between Si and Its Thermally Grown Oxide D. E. Aspnes, J. B. Theeten Physical Review Letters Materials ScienceSitu Optical PropertiesIi-vi SemiconductorOptical MaterialsEngineering	1979	118
The structure of oxygen adsorbed on Ni(001) as determined by ion scattering spectroscopy H.H. Brongersma, J. B. Theeten Surface Science Surface CharacterizationOxygen Reduction ReactionChemical EngineeringEngineeringSurface Chemistry	1976	97
Ellipsometry in Thin Film Analysis J. B. Theeten, D. E. Aspnes Annual Review of Materials Science Additive Manufacturing TechniquesEngineeringThin Film AnalysisMicroscopyMechanical Engineering	1981	83
Spatially resolved ellipsometry M. Erman, J. B. Theeten Journal of Applied Physics Integral GeometryEllipsometric MeasurementEngineeringGeometryOptical Testing	1986	72
Characterization of low-pressure chemical-vapor-deposited and thermally-grown silicon nitride films F.H.P.M. Habraken, A. E. T. Kuiper, A. van Oostrom, Journal of Applied Physics Materials ScienceSemiconductorsEngineeringHard CoatingSurface Science	1982	61

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