IEEE Electron Device Letters · 1982 · 41 citations · 2 references
EngineeringElectrical EngineeringCircuit TheoryMicroelectronicsSemiconductor DevicesCarrier TransportField-effect TransistorsHigh-frequency Semiconductor DevicesMetal-oxide-semiconductor Field-effect TransistorsModulationRadio-frequency Integrated CircuitsField-effect Transistor BiasingField-effect Transistor Transfer CharacteristicsNoise In Field-effect TransistorsSignal-to-noise RatioSignal-to-noise Ratio AnalysisSiliconTransistor Noise
Novel dual-base, dual-collector, lateral transistors operating in the presence of dc and ac magnetic fields, demonstrate that the differential current at the collector is the result of emitter injection modulation and not carrier deflection. An understanding of basic operating principles has resulted in the design of optimized lateral- and vertical-injecting transitor configurations. The latter exhibit voltage sensitivities exceeding 20 V/T for NPN silicon, at room temperature, and a signal-to-noise ratio of 10 <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">5</sup> for a 1 T magnetic field. A frequency response in excess of 50 MHz should be possible for load resistances less than 1000 ohms.
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Concentrating Holes and Electrons by Magnetic Fields
H. Suhl, W. Shockley · Physical Review · 1949 · 51 citations