Publication | Closed Access
Analysis of field emission from three-dimensional structures
42
Citations
10
References
1992
Year
EngineeringGlow DischargeElectron DiffractionElectron OpticElectromagnetic CompatibilityBeam OpticPlasma ElectronicsElectron SpectroscopyOptical PropertiesField Enhancement FactorComputational ElectromagneticsInstrumentationElectromagnetic WaveElectrical EngineeringPhysicsField EmissionSynchrotron RadiationNatural SciencesSpectroscopyApplied PhysicsEmitter Tips
An analysis of the field emission from emitter tips with the geometry of a prolate ellipsoid of revolution indicates that the field enhancement factor, β, and effective emission area, α, are not constant but instead depend on the applied field. The added complexity of a materials related limit on the minimum time for transition of an electron from the solid into the vacuum is also examined in the analysis. The calculated variations of α and β are as large as 35%, and in some instances could result in erroneous interpretation of measured current-voltage (I-V) characteristic data.
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